VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (Communications in Computer and Information Science, 1066)
by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
This proceedings volume gathers revised selected papers from the 23rd International Symposium on VLSI Design and Test, held in Indore, India, in July 2019. Covering broad themes in VLSI design and testing, it serves as a technical reference for researchers, students, and professionals in computing and electronics.
About This Book
This volume presents the revised selected papers from the 23rd International Symposium on VLSI Design and Test, held in Indore, India, from July 4–6, 2019.
It focuses on the broad fields of very-large-scale integration design and testing, offering a technical reference for readers interested in developments across these areas.
Edited by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, and Santosh Kumar Vishvakarma, the book appears in the Communications in Computer and Information Science series.
Researchers, students, and professionals in computer engineering, electronics, and related technology fields may find this proceedings volume a useful source of scholarly material.
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