VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers (Communications in Computer and Information Science, 1066)
by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
Revised selected papers from the 23rd International Symposium on VLSI Design and Test held in Indore, India, July 2019.
About This Book
This volume presents revised selected papers from the 23rd International Symposium on VLSI Design and Test (VDAT 2019).
The symposium took place in Indore, India, from July 4 to 6, 2019.
Topics cover advances in VLSI design, testing methodologies, and related computer and information science areas.
Editors include Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, and Santosh Kumar Vishvakarma.
Reviews
No reviews yet. Be the first to review this book!