On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
This technical work examines on-wafer calibration techniques used to accurately characterize high-performance silicon devices at millimeter-wave frequencies and beyond. It provides a focused resource for readers interested in high-frequency measurement, silicon technology, electronic devices, and the challenges of reliable device characterization.
About This Book
This work focuses on on-wafer calibration techniques for characterizing high-performance silicon devices.
It addresses measurement accuracy at millimeter-wave frequencies and beyond.
The book is suited to readers seeking technical information on device characterization, calibration, and high-frequency silicon technologies.
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