Exponential Fatigue Life Model for Single-Edge-Notched Beams: An Analytical Approach to Structural Integrity and Fracture Behaviour
by Avaya Kumar Baliarsingh, Debabrata Rath
Explore the exponential fatigue life model for single-edge-notched beams in this analytical study by Avaya Kumar Baliarsingh and Debabrata Rath. The book delves into structural integrity and fracture behavior, providing essential tools for engineers to evaluate material performance under stress. Ideal for professionals in materials science and structural analysis.
About This Book
This work by Avaya Kumar Baliarsingh and Debabrata Rath introduces an exponential fatigue life model tailored for single-edge-notched beams.
The analytical method addresses key aspects of structural integrity, providing insights into how materials respond under fatigue conditions.
Fracture behavior is examined through this model, offering a foundation for assessing beam durability in engineering contexts.
The approach emphasizes precision in predicting fatigue life, aiding in the design and analysis of notched structures.
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