X-Ray Diffraction: From Basics to Nanostructure Determination (Chinese Edition)
by Gu Xu, Associate Researcher At The Prigogine Center For Statistical Mechanics & Complex Systems Ping Chen
This Chinese-language edition introduces X-ray diffraction from its basic principles through the study of nanostructure determination. Written by Gu Xu and Ping Chen, it is suited to readers seeking a focused scientific treatment of diffraction and its relationship to nanoscale structural analysis.
About This Book
X-Ray Diffraction: From Basics to Nanostructure Determination presents the subject of X-ray diffraction in a Chinese-language edition.
The book covers foundational aspects of X-ray diffraction and connects them with the determination of nanostructures.
It is authored by Gu Xu and Ping Chen, Associate Researcher at the Prigogine Center for Statistical Mechanics & Complex Systems.
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