Chemical-Mechanical Planarization: Volume 867: Integration, Technology and Reliability (MRS Proceedings)
by E. C. Johns, A. Kumar, J. A. Lee, Y. S. Obeng, I. Vos
Proceedings volume exploring chemical-mechanical planarization, focusing on integration, technology, and reliability for semiconductor applications.
About This Book
This volume presents research and developments in chemical-mechanical planarization processes used in semiconductor manufacturing.
Topics include integration challenges, process technology, and reliability considerations for advanced device fabrication.
Contributions address materials, equipment, and methodologies relevant to planarization in microelectronics production.
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