Applied Logistic Regression (Wiley Series in Probability and Statistics)
by David W. Hosmer Jr., Stanley Lemeshow, Rodney X. Sturdivant
This book in the Wiley Series in Probability and Statistics introduces applied logistic regression, a vital tool for modeling binary outcomes. Authored by experts David W. Hosmer Jr., Stanley Lemeshow, and Rodney X. Sturdivant, it delivers practical insights into model development, estimation, and evaluation for statistical practitioners across disciplines.
About This Book
Applied Logistic Regression is a key text in the Wiley Series in Probability and Statistics, authored by David W. Hosmer Jr., Stanley Lemeshow, and Rodney X. Sturdivant. It focuses on the practical application of logistic regression techniques for analyzing categorical data.
The book provides detailed explanations of logistic regression models, emphasizing their use in probability and statistical inference. It covers foundational concepts and advanced topics relevant to researchers and practitioners in various fields.
Readers will find guidance on model fitting, interpretation, and assessment, making it a valuable resource for statistical analysis involving binary or ordinal responses. The content is structured to support both theoretical understanding and real-world implementation.
As part of a renowned series, this edition builds on established methodologies to address contemporary challenges in data analysis.
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