Advanced VLSI Design and Testability Issues
by Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
Advanced VLSI Design and Testability Issues examines the technical challenges of designing and testing very-large-scale integrated circuits. Combining the subjects of VLSI design and testability, it offers a focused resource for students, researchers, and engineering professionals interested in integrated-circuit development and evaluation.
About This Book
Advanced VLSI Design and Testability Issues focuses on the design of very-large-scale integrated circuits and the challenges of verifying their operation.
The book brings together the closely related areas of VLSI design and testability, providing a technical perspective on both circuit development and evaluation.
It is suited to readers seeking an advanced introduction to issues encountered in modern integrated-circuit engineering.
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