Defect and Microstructure Analysis by Diffraction (International Union of Crystallography Monographs on Crystallography)
by Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge
This book presents diffraction methods for analyzing defects and microstructures in crystalline materials. Part of the IUCr Monographs on Crystallography, it is authored by leading experts Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge, providing a comprehensive guide for crystallographers and materials scientists.
About This Book
Defect and Microstructure Analysis by Diffraction is a specialized volume in the International Union of Crystallography Monographs on Crystallography series. Authored by Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge, it focuses on diffraction-based approaches to studying material imperfections.
The book details methodologies for examining microstructures through crystallographic techniques, offering insights into defect identification and analysis. It serves as a key resource for understanding how diffraction reveals structural properties in crystals.
Designed for experts in the field, the monograph emphasizes practical applications of diffraction in materials research, contributing to advancements in crystallography.
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