Reliability and Failure of Electronic Materials and Devices
by Milton Ohring, Lucian Kasprzak
Reliability and Failure of Electronic Materials and Devices by Milton Ohring and Lucian Kasprzak delves into the critical aspects of electronic component durability and breakdown. It provides foundational knowledge for professionals working with semiconductors, circuits, and related technologies, emphasizing prevention strategies and analysis techniques.
About This Book
Reliability and Failure of Electronic Materials and Devices offers a comprehensive examination of the factors influencing the performance and longevity of electronic components.
Authored by Milton Ohring and Lucian Kasprzak, it addresses key principles and practical considerations in electronic materials engineering.
The text serves as a valuable resource for understanding failure modes and enhancing device reliability in various applications.
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